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AKŞİMŞEK, HÜSEYİN SİNAN

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Dr. Öğr. Üyesi

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AKŞİMŞEK

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HÜSEYİN SİNAN

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2017 - 20182
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Author: Jussila, Henri

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    Graphene-MoS2-Metal Hybrid Structures for Plasmonic Biosensors
    (Elsevier, 2018-12-01) Jussila, Henri; Sun, Zhipei; AKŞİMŞEK, HÜSEYİN SİNAN; 107154
    Surface Plasmon Resonance (SPR) biosensors are widely used for real-time label-free detection in medical diagnostics, pharmaceutical researches and food safety. Although there is a growing interest in miniaturization of biosensors for self-detection and diagnostics at out of laboratory, the performance of conventional metal SPR sensors is still limited. In this paper, we propose graphene–MoS 2 – metal hybrid structures based plasmon sensors under the best minimum light intensity approach, which represents the performance analysis in case of the lowest reflected light strength. It is demonstrated that the metal thickness can be reduced from 55 nm to 32 nm and 37 nm meanwhile the performance of the background sensor can be improved by 87% and 13% with the 4 additional MoS2 and graphene layers, respectively. We show that MoS2 based SPR devices provide much better sensitivity performance than graphene based devices. Our results reveal the another promising property of MoS2: The sensitivity of SPR sensors can be greatly increased with a few number of MoS2 within the angular SPR system while reducing the size of the device, especially for particular applications such as detecting a single molecule and biosensing at low biomolecule concentration. Furthermore, we show that the equivalent optical properties of multilayered nanostructures also depend on the layer thickness which is a novel knowledge for the next studies on 2D material based SPR plasmonic devices.
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    New approach for thickness determination of solution-deposited graphene thin films
    (Amer Chemical Soc, 1155 16th St, Nw, Washington, Dc 20036 USA, 2017-06) Jussila, Henri; Albrow Owen, Tom; Yang, He; Hu, Guohua; Granqvist, Niko; Lipsanen, Harri; Howe, Richard C. T.; Sun, Zhipei; Hasan, Tawfique; AKŞİMŞEK, HÜSEYİN SİNAN; 107154
    Solution processing-based fabrication techniques such as liquid phase exfoliation may enable economically feasible utilization of graphene and related nanomaterials in real-world devices in the near future. However, measurement of the thickness of the thin film structures fabricated by these approaches remains a significant challenge. By using surface plasmon resonance (SPR), a simple, accurate, and quick measurement of the deposited thickness for inkjet-printed graphene thin films is reported here. We show that the SPR technique is convenient and well-suited for the measurement of thin films formulated from nanomaterial inks, even at sub-10 nm thickness. We also demonstrate that the analysis required to obtain results from the SPR measurements is significantly reduced compared to that required for atomic force microscopy (AFM) or stylus profilometer, and much less open to interpretation. The gathered data implies that the film thickness increases linearly with increasing number of printing repetitions. In addition, SPR also reveals the complex refractive index of the printed thin films composed of exfoliated graphene flakes, providing a more rigorous explanation of the optical absorption than that provided by a combination of AFM/profilometer and the extinction coefficient of mechanically exfoliated graphene flakes. Our results suggest that the SPR method may provide a new pathway for the thickness measurement of thin films fabricated from any nanomaterial containing inks.